Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

作 者： 楊遠(yuǎn)洪 于洪濤   作者單位： The Institute of Optoelectronics Technology, Beijing University of Aeronautics & Astronautics, Beijing,100083  刊 名： 中國(guó)光學(xué)快報(bào)（英文版）  ISTIC EI 英文刊名： CHINESE OPTICS LASERS  年，卷(期)： 2004 2(11)  分類號(hào)：   關(guān)鍵詞：